ProCon X-Ray
- X-ray microscopes
X-ray microscopes - devices for scanning in the highest resolution
CT microscopes from ProCon X-Ray offer the perfect solution for situations where you need more than just high resolution. These systems are specially developed for the highest resolution available on the market.
- CT-ALPHA Nanotube
- CT-NANO
CT-ALPHA Nanotube
CT-NANO
X-ray microscope CT-ALPHA Nanotube
CT-system for resolutions down to 150 nm.
The CT-ALPHA nanotube provides a unique solution for high-resolution measurements far ahead of established industrial micro CT scanners by applying the latest developments from X-ray research.
Features and parameters of the device:
- Min. voxel sampling 50 nm;
- Spatial resolution of 150 nm;
- Photon counting detector;
- Variable field of view;
- Automatic alignment;
- State-of-the-art reconstruction;
- CT-system for resolutions down to 150 nm
CT-ALPHA Nanotube system combines the latest state-of-the-art components for the highest resolution. Experience in both hardware and software design enables us to perfectly adapt systems to individual needs of customer. Besides high-precision components, the state-of-the-art reconstruction algorithms are the key of success.
One main component of the system is Excillum’s high performance X ray source NanoTube N3, an up to 160 kV X-ray tube with latest tungsten-diamond transmission target technology, automatic beam focusing and astigmatism correction, ensuring that the smallest possible, truly round X-ray spot is achieved.
The second main component is the photon counting X ray detector from DECTRIS. This detector enables an optimum signal-to-noise ratio due to zero readout noise and zero dark current.
Two separate manipulation systems allow a very precise detector and sample positioning. A high-precision air bearing rotary stage delivers a well-defined sample rotation, mounted on top of a linear position system with 3 degrees of freedom (DOFs). A separate manipulation (2 DOFs) system on top of the rotation stage is installed for automatically adjusting the sample position in the center of the rotation.
Specifications ProCon X-Ray CT-ALPHA Nanotube
|
Min. Min. voxel sampling |
50 nm |
|
Max. geometric magnification |
Up to 1,500 x for CT |
|
Detector |
Zero dark current |
|
Active area |
2,000 x 500 pikseli; 75 µm rpixel size |
|
High efficiency even on low energies |
For low contrast samples |
|
Variable field of view |
100 µm – 10 mm |
|
Spatial resolution |
down to150 nm |
|
Max. voltage |
up to 160 kV |
|
Axis system |
12-axes manipulator |
|
Axis resolution |
< 100 nm |
|
Automatic alignment |
Easy-to-use workflow |
|
State-of-the-art reconstruction |
Implemented |
|
Compact design |
Small footprint of 2.0 m x 1.0 m |
X-ray microscope CT-NANO
Explore new possibilities for visualization with 3D X-ray imaging for materials research, life sciences, natural resources and industrial applications.
- X-ray Computed Tomography (nanoCT);
- Scanning Electron Microscope (SEM);
- Digital Radiography (DR);
- Energy-Dispersive X ray spectroscopy (EDX);
- 3D volume CT;
- Non-destructive testing (NDT) – 2D and 3D;
- Quality control independent of material;
- Defect recognition (voids, cracks, …);
- Radiation safety better than 1 µSv/h.
CT-NANO PROCON X-Ray has the best resolution available on the market at this energy level, which allows the inspection of materials or structures which were not possible before.
The CT-NANO is a fully operating scanning electron microscope with capabilities of Nano-CT measurements on specimens like light-metal-alloys and fibre composites.
It delivers Voxel-sizes in ranges from 30 nm to 10 μm, a geometrical magnification up to 50nm (FWHM) and a maximum photon energy of 30 keV. An EDS-Detector provides an additional correlation between XRF signal of specimen and reconstructed volume of the CT-NANO.
With a direct-converting detector and a size-optimized field-of-view, the CT-NANO provides a representative test volume. The CT-NANO X-ray microscope is based on a scanning electron microscope and uses the electron-beam for generating the x-ray at an ultra-sharp needle with a focal spot size of 70 nm.
Specifications ProCon X-Ray CT-NANO
CT- Mode
|
Field of view |
Ø 49 – 3414 μm |
|
Geometric magnification |
20 x – 1400 x |
|
Voxel sampling |
39 – 2.750 nm |
|
Spatial resolution |
up to 60 nm |
|
Reconstruction |
TV-SART |